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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Xufeng Wang Alam, M.A. |
| Copyright Year | 2013 |
| Description | Author affiliation: Purdue Univ., West Lafayette, IN, USA (Xufeng Wang; Alam, M.A.) |
| Abstract | Random surface texturing allows efficient light-trapping and therefore, is widely used in commercial c-Si PV technology. The geometry, periodicity, and interface characteristics of the texture greatly impact the efficiency of the c-Si solar cells, and thus, the ability to evaluate the texture `quality' in a time-and-cost effective manner without sophisticated metrology is desired. In this paper, we report a simple and efficient algorithm to estimate the pyramid density via standard capacitance-voltage measurement. We demonstrate that the overall capacitance of a random pyramid surface can be decomposed into three distinct capacitive components, and this decomposition can be used to estimate the pyramid density. We validate the algorithm by sampling the pyramid density of commercial c-Si solar cells and show that the density obtained from image analysis is consistent with the estimates suggested by the purposed model. |
| Sponsorship | IEEE Electron Devices Soc. |
| Starting Page | 1 |
| Ending Page | 5 |
| File Size | 2898450 |
| Page Count | 5 |
| File Format | |
| DOI | 10.1109/PVSC.2013.6744420 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-06-16 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Capacitance Photovoltaic cells Surface texture Silicon Three-dimensional displays Surface topography Numerical analysis silicon surface texture capacitance-voltage characteristics statistical analysis photovoltaic cells |
| Content Type | Text |
| Resource Type | Article |
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