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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chaoran Yang Lee, S.W.R. |
| Copyright Year | 2015 |
| Description | Author affiliation: Dept. of Mech. & Aerosp. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China (Chaoran Yang; Lee, S.W.R.) |
| Abstract | The present study belongs to a series of investigations on the degradation mechanism of the Cu-Sn intermetallic compound (IMC) layers in Sn-Ag-Cu (SAC) solder joints under the thermal aging condition. The root cause of IMC strength weakening is identified as the nucleation of the $Cu_{3}Sn$ grains that turns the microstructure of the IMC layer from a single-stack structure to a multi-stack structure. To demonstrate the process, and also to further investigate the microstructure effect of the $Cu_{3}Sn$ layer on the fracture behavior of the Cu-Sn IMCs, a meso-scale, grain level finite element modeling analysis was performed. The stochastic geometry of the $Cu_{3}Sn$ grains was constructed using a Voronoi tessellation diagram. A Cohesive Zone Model (CZM) approach was adopted in the numerical framework by embedding the cohesive interface element at the grain boundaries to simulate the interfacial fracture behavior. The competition between the $Cu_{6}Sn_{5}/Cu_{3}Sn$ interfacial fracture and the intergranular fracture of the $Cu_{3}Sn$ layer when the $Cu_{3}Sn$ layer present different microstructures was investigated. The results were used to verify the $Cu_{3}Sn-contolling$ thermal degradation mechanism. |
| Starting Page | 1029 |
| Ending Page | 1037 |
| File Size | 1900492 |
| Page Count | 9 |
| File Format | |
| ISBN | 9781479986095 |
| DOI | 10.1109/ECTC.2015.7159722 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-05-26 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Finite element analysis Grain boundaries Load modeling Aging Soldering Microstructure Thermal degradation |
| Content Type | Text |
| Resource Type | Article |
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