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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yichi Zhang Wojewoda, L. Aygun, K. |
| Copyright Year | 2015 |
| Description | Author affiliation: Assembly & Test Technol. Dev, Intel Corp., Chandler, AZ, USA (Yichi Zhang; Wojewoda, L.; Aygun, K.) |
| Abstract | In today's high speed digital circuit design, some high data rate signal paths require interconnect simulations up to 100 GHz. One of the major challenges for these simulations is generating reliable and accurate frequency dependent material models for dielectric constant (dk) and loss tangent (df). This paper will present a metrology for measurement of typical interconnect materials using cavity resonators including a method to capture all measurement variations. Once a precise metrology is established, the paper will then use the collected data to provide additional insight into popular modeling methods used to extrapolate data beyond measurement frequency. For the type of materials measured, specific recommendations will be made on the modeling parameters to have the most accurate high-frequency models for typical package substrate materials. |
| Starting Page | 506 |
| Ending Page | 511 |
| File Size | 956525 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781479986095 |
| DOI | 10.1109/ECTC.2015.7159637 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-05-26 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Cavity resonators Dielectric measurement Resonant frequency Metrology Integrated circuit modeling Fabry-Perot Frequency measurement Signal Integrity Dielectric constant Loss Tangent Material Characterization Resonator Debye Model |
| Content Type | Text |
| Resource Type | Article |
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