NDLI: Aging kinetics for temperature loads of z-conductive adhesives in-situ monitoring of the contact resistance of heat seal connectors

Content Provider	IEEE Xplore Digital Library
Author	Caers, J.F.J.M. Kessels, F.J.H.
Copyright Year	1997
Description	Author affiliation: Philips Centre for Manuf. Technol., Eindhoven, Netherlands (Caers, J.F.J.M.)
Abstract	In-situ contact resistance measurements are shown to be a very powerful experimental tool to determine the ageing kinetics of new types of interconnections. As an example of a z-conductive adhesive interconnection, heat seal connectors to a printed board are taken; these are a low-cost option to interconnect liquid crystal displays (LCDs) and printed boards. The approach consists of the measurement with a high resolution of the contact resistance during a hot storage test. Based on a 1000h test, a first estimate of the activation energy for ageing in static temperature conditions is given, and an extrapolation to user conditions is made. The strength of the approach is illustrated by showing the effect of a different board layout on the eventual life time of the interconnection.
Starting Page	153
Ending Page	157
File Size	768478
Page Count	5
File Format	PDF
ISBN	078033857X
ISSN	05695503
DOI	10.1109/ECTC.1997.606161
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-05-18
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Aging Kinetic theory Temperature Contact resistance Electrical resistance measurement Testing Seals Connectors Liquid crystal displays Energy resolution
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in