NDLI: Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si:H TFT Scan Driver

Content Provider	IEEE Xplore Digital Library
Author	Tsung-Ching Huang Huai-Yuan Tseng Chen-Pang Kung Kwang-Ting Cheng
Copyright Year	2007
Description	Author affiliation: Univ. of California, Santa Barbara (Tsung-Ching Huang; Kwang-Ting Cheng) \|\| Ind. Technol. Res. Inst., Hsinchu (Huai-Yuan Tseng; Chen-Pang Kung)
Abstract	Flexible electronics fabricated with thin-film and bendable substrates (e.g., plastic) have great potential for novel applications in consumer electronics such as flexible displays, e-paper, and smart labels; however, the key elements - namely thin-film transistors (TFTs) - often suffer from electrical instability. Therefore, thorough reliability analysis is critical for flexible circuit design to ensure that the circuit would operate reliably throughout its lifetime. In this paper, we propose a methodology for a-Si:H TFT circuits' reliability simulation. We show that: (1) the threshold voltage $(V_{TH})$ shift of a single TFT can be modeled by analyzing its operating conditions and (2) the circuit lifetime can be predicted accordingly using SPICE. We also propose an algorithm to reduce the simulation time by orders of magnitude with negligible accuracy loss. To validate our analytical model and simulation methodology, we compare the SPICE simulation results with the actual measurements of our integrated a-Si:H TFT scan driver fabricated on the glass substrate and demonstrate very high consistency in the overall results.
Starting Page	966
Ending Page	969
File Size	1753924
Page Count	4
File Format	PDF
ISBN	9781595936271
ISSN	0738100X
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-06-04
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Association for Computing Machinery, Inc. (ACM)
Subject Keyword	Flexible electronics Thin film transistors Driver circuits Circuit simulation Analytical models Substrates SPICE Plastic films Thin film circuits Consumer electronics Scan Driver Design Reliability Experimentation Flexible Electronics Threshold Voltage Amorphous Hydrogenated Silicon (a-Si:H) Thin-Film Transistor
Content Type	Text
Resource Type	Article

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