NDLI: Stochastic model and simulation of a random number generator circuit

Content Provider	IEEE Xplore Digital Library
Author	Peng Xu Horiuchi, T. Abshire, P.
Copyright Year	2008
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD (Peng Xu; Horiuchi, T.; Abshire, P.)
Abstract	In this paper, we describe a method for transient stochastic analysis and apply it to develop a stochastic model for a true random number generator (RNG) circuit using intrinsic circuit noise. We use numerical simulation of stochastic differential equations to obtain time-domain transient analysis of the circuit. The simulation shows similar stochastic behavior and probability tuning as that observed in measurements of the fabricated chips. We further develop a small signal stochastic model of the circuit. The model reveals the role each device plays in contributing to overall stochastic behavior. The model and the simulation allow us to predict how the device parameters affect the performance. The method we propose here can be applied to other circuits where stochastic sample paths and ensemble statistics are necessary to characterize the circuits. Traditional noise analysis in the frequency domain is not adequate to provide this information.
Starting Page	2977
Ending Page	2980
File Size	385680
Page Count	4
File Format	PDF
ISBN	9781424416837
DOI	10.1109/ISCAS.2008.4542083
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-05-18
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Stochastic processes Circuit simulation Random number generation Stochastic resonance Transient analysis Circuit noise Predictive models Numerical simulation Differential equations Time domain analysis
Content Type	Text
Resource Type	Article

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