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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | De Lima, J.A. Pimenta, W.A. |
| Copyright Year | 2008 |
| Description | Author affiliation: Brazil Semicond. Technol. Center, Campinas (De Lima, J.A.; Pimenta, W.A.) |
| Abstract | A current limiter that securely clamps the LDO output current upon load over-current is presented. Although the approach relies on absolute values of parameters such as resistance and MOSFET threshold voltage on subsequent I/V and V/I conversions of the LDO sensed current, a reference current to the arbitration circuit is derived in such a manner that the dependence of the clamping value $l_{CLP}$ on process and temperature variations is canceled out at good extent. Furthermore, the sense circuit uses a p-MOSFET depletion device to comply with very low dropouts. For a nominal value of 750 mA, minimum and maximum simulated values of $I_{CLP}$ are 570 mA and 930 mA, respectively, for a broad biases, process spread and temperatures ranging from -40degC to 150degC. An LDO with 400 mA-current capability and 250 mV-dropout embedding the proposed limiter was integrated on a high-voltage process. Experimental data attest the clamping functionality and accuracy of the proposed circuit for low and large dropouts. |
| Starting Page | 2238 |
| Ending Page | 2241 |
| File Size | 227946 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424416837 |
| DOI | 10.1109/ISCAS.2008.4541898 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-05-18 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Current limiters Regulators Temperature sensors Clamps Protection MOSFET circuits Threshold voltage Temperature dependence Circuit simulation Temperature distribution |
| Content Type | Text |
| Resource Type | Article |
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