NDLI: Interpretation of X-Ray Line Profile of Polycrystalline <formula formulatype=inline><tex Notation=TeX>${hbox {MgB}}

Content Provider	IEEE Xplore Digital Library
Author	Hanafusa, K. Yamamoto, A. Ogino, H. Horii, S. Shimoyama, J.-i. Kishio, K.
Copyright Year	2002
Abstract	XRD peak profile analysis was performed on polycrystalline MgB₂ bulks and tapes manufactured by various heat treatment conditions in order to investigate statistical value of crystallite size. Volume-weighted and area-weighted mean diameter of a bulk sample heated at 600degC for 6 h were estimated to be approximately 90 nm and 20 nm, respectively. These suggest that crystallite size distribution of MgB₂ is very wide, although a lot of very small crystallites exist. Similar tendencies were observed for other samples. On the other hand J _c values were found to be rather low compared to the expected values considering its small D _a . This indicates that a small portion of crystallite interfaces act as effective pinning centers.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	2690
Ending Page	2693
Page Count	4
File Size	243890
File Format	PDF
ISSN	10518223
Volume Number	19
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	X-ray imaging Crystallization Grain size Superconducting materials Powders Temperature Magnetic fields X-ray diffraction Performance analysis Manufacturing X-ray line profile analysis Crystallite size magnesium diboride polycrystalline bulks and tapes
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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