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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Pogue, N. Blackburn, R. McIntyre, P. Sattarov, A. |
| Copyright Year | 2002 |
| Abstract | A superconducting test cavity and cryostat are being developed to support the testing of round wafer samples of new superconducting materials. The cavity is designed to test these samples in surface fields up to and beyond the BCS limit of Nb. The design is optimized to produce maximum surface field on the sample compared with that elsewhere in the cavity. It operates in the TE011 mode. A dielectric hemisphere of low-loss sapphire is located just above the wafer surface and serves to concentrate the surface field. The sapphire is cooled by a column of superfluid He, with sufficient heat transport to maintain high Q throughout the rf pulse. It should be possible to test a sample to twice the BCS limit of Nb while measuring the rf surface resistance of the sample. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 1409 |
| Ending Page | 1411 |
| Page Count | 3 |
| File Size | 1393694 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 19 |
| Issue Number | 3 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Dielectrics Niobium Superconducting microwave devices Surface resistance Superconducting materials Materials testing Linear particle accelerator Acceleration Electric breakdown Superconducting films microwave Cavity dielectric heterostructure linac |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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