NDLI: Preparation of <formula formulatype=inline><tex Notation=TeX>${rm CeO}_{2}/{rm La}_{2}{rm Zr}_{2}{rm O}_{7}$</tex></formula> Buffer Layers on Textured Ni5W Substrates by Chemical Solution Deposition Method

Content Provider	IEEE Xplore Digital Library
Author	Yanling Cheng Hongli Suo Dong He Yue Zhao Mangmang Gao Min Liu Ye Shuai Yonghua Zhu Rong Wang Lin Ma Meiling Zhou
Copyright Year	2002
Abstract	CeO₂ caped La₂Zr₂O₇ (LZO) buffer layers on cube-textured Ni5W substrates were fabricated by the method of chemical solution deposition(CSD). The orientation of both LZO film and CeO₂/LZO buffer layer was investigated using conventional XRD and X-ray four circle diffractometers, respectively. The results reveal that both the LZO film on Ni5W substrates and CeO₂ film on LZO buffer layer are grown epitaxially. The value of Full Width at Half Maximum (FWHM) of (111) Phi scan of CeO₂/LZO buffer layer is around 8^deg, and the FWHM of (200) omega-scan of CeO₂/La₂Zr₂O₇ buffer layer is 6.5^deg, indicating a good in-plan orientation of the as obtained buffer layers. It was observed by the high resolution SEM that the surface of LZO buffer layer is crack-free and very dense. The surface result observed by AFM indicates a very smooth CeO₂ surface with 5.9 nm of the root mean square roughness measured in an areas of 30 times 30 mum². AES depth profile results of CeO₂/LZO buffer layers shows that the deposited LZO film could effectively prevent the diffusion of Ni into the buffer layer.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	3423
Ending Page	3426
Page Count	4
File Size	1009641
File Format	PDF
ISSN	10518223
Volume Number	19
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Buffer layers Rough surfaces Surface roughness Surface cracks Zirconium Substrates Chemicals X-ray scattering X-ray diffraction Root mean square ${\rm La}_{2}{\rm Zr}_{2}{\rm O}_{7}$ Buffer layer CeO2 chemical solution deposition
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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