NDLI: The Influence of Bending Strain on the Critical Current of <formula formulatype=inline><tex Notation=TeX>${rm Nb}_{3}{rm Sn}$</tex></formula> Strands With Different Filament Twist Pitch

Content Provider	IEEE Xplore Digital Library
Author	Corato, V. Muzzi, L. della Corte, A. Di Zenobio, A. Turtu, S. Viola, R.
Copyright Year	2002
Abstract	The effect of bending strain on the transport properties of Nb₃Sn strands has been the object of several investigations in the last years. We report on the performances of internal tin Nb₃Sn strands with different filament twist pitches, pre-compressed by swaging into thin stainless steel tubes before the reaction heat treatment and subject to pure bending strain. We have previously reported on the comparison between the performances of the technological OST-Dipole strand (TW-strand) with those of the same strand, but with untwisted superconducting filaments (UNTW-strand). The critical current, as well as the n-index of the samples with twisted filaments gradually degraded with the applied bending strain, while an enhancement of the performances has been observed on UNTW-strands. Here, results on further experimental measurements carried out on OKSC internal tin strands with different filament twist pitches are discussed, in order to clarify some aspects of the current transfer process within the strands. Finally, we carried out an analysis through the second derivative of the V-I curve, which evidenced a peaked critical current distribution for the UNTW-strands, while TW-strands under bending showed a higher degree of non-homogeneity, proven by broader distributions.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	2624
Ending Page	2627
Page Count	4
File Size	372267
File Format	PDF
ISSN	10518223
Volume Number	19
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Capacitive sensors Critical current Tin Niobium Swaging Steel Heat treatment Superconducting materials Degradation Current measurement twist pitch Bending strain critical current ${\rm Nb}_{3}{\rm Sn}$
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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