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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Godeke, A. Turrioni, D. Boutboul, T. Cheggour, N. Ghosh, A.K. Goodrich, L.F. Meinesz, M. den Ouden, A. |
| Copyright Year | 2002 |
| Abstract | We report on a multi-institute comparison of critical current data measured on a modern NbTi wire for the Large Hadron Collider (LHC), which has shown a standard deviation below 1% in critical current density spread in more than 1500 measurements. Interlaboratory comparisons on Nb3Sn wires have shown ambiguities that could be attributable to strain related differences in critical current density, originating from differences in sample handling, reaction, and mounting techniques, or also to differences in the magnetic field and current calibrations between the institutes. A round robin test of a well characterized NbTi wire provides a baseline variance in critical current results that is presumed to be attributable only to differences in the characterization systems. Systematic differences on the order of 3.5% are found in the comparison. The most likely cause for the observed differences is a small diameter holder that brings the wire into a strain regime in which strain effects can no longer be ignored. A NbTi round robin test, when performed properly, will separate system differences from sample specific differences and provide laboratories with an opportunity to calibrate equipment against a standard measurement. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 2633 |
| Ending Page | 2636 |
| Page Count | 4 |
| File Size | 234692 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 19 |
| Issue Number | 3 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Niobium compounds Titanium compounds Critical current Current measurement Wire Density measurement Large Hadron Collider Measurement standards Critical current density Magnetic field measurement standardization NbTi round robin |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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