NDLI: A new process capability index under multiplicative adjustment of process mean and its demonstration procedures

Content Provider	IEEE Xplore Digital Library
Author	Kim, K.W. Yum, B.J.
Copyright Year	2007
Description	Author affiliation: Korea Adv. Inst of Sci. & Technol., Daejeon (Kim, K.W.; Yum, B.J.)
Abstract	In the process capability study, it has been undisputedly assumed that the standard deviation of a quality characteristic is unchanged even if its mean is adjusted for the purpose of process centering. However, this assumption is not valid for the case of the multiplicative adjustment of the mean, which appears more commonly in practice. In addition, little research has addressed the issue of "process capability demonstration". In this paper, a new process capability index is proposed for the nominal-the-best characteristic under the multiplicative adjustment of the mean, its lower confidence limit is derived, and a demonstration procedure is developed so that the required sample size can be determined to achieve a desired probability of successfully demonstrating that the process capability index meets the target with a specified level of confidence.
Starting Page	1269
Ending Page	1272
File Size	412385
Page Count	4
File Format	PDF
ISBN	9781424415281
DOI	10.1109/IEEM.2007.4419396
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-12-02
Publisher Place	Singapore
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Multiplicative adjustment Lower confidence limit Process capability demonstration. Industrial engineering Process capability index Reliability engineering Niobium
Content Type	Text
Resource Type	Article

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