NDLI: Analog Circuit Testing Using Auto Regressive Moving Average Models

Content Provider	IEEE Xplore Digital Library
Author	Ayres, J. Bushnell, M.L.
Copyright Year	2007
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ (Ayres, J.; Bushnell, M.L.)
Abstract	The paper present a new method of testing analog circuits based on spectral estimation using auto regressive moving average (ARMA) models. A tiered testing approach was used where each tier becomes progressively more computationally expensive. Badly damaged circuits are quickly eliminated without wasting tester time. The models are generated using input and output analog circuit samples. Results are presented for two passive filters and an active multiplier/modulator. The first two levels of the tiered testing approach use model parameters and the third tier estimates the spectral content of the circuits' output. Incorporating this method into an analog/mixed-signal built-in-self-test (BIST) environment is also discussed, including hardware overhead and general implementation. The 3-tiered ARMA testing method was highly effective, had 0% yield loss, and achieved low defect level of 0.0821514 on a population of 28,290 circuit variations generated by Monte-Carlo analysis
Sponsorship	VLSI Soc. of India IEEE CAS Soc. IEEE ED Soc. ACM IEEE SSC Soc
Starting Page	775
Ending Page	780
File Size	378230
Page Count	6
File Format	PDF
ISBN	0769527620
ISSN	10639667
DOI	10.1109/VLSID.2007.35
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-01-06
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Analog circuits Built-in self-test Hardware Costs System-on-a-chip Production Automatic testing Analog-digital conversion Signal generators
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture

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