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Content Provider | IEEE Xplore Digital Library |
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Author | Todd, M.D. Moro, E.A. Puckett, A. |
Copyright Year | 2012 |
Description | Author affiliation: Los Alamos National Laboratory, INST-OFF, MS T001 Los Alamos, New Mexico 87545 (Moro, E.A.) || Dept. of Structural Engineering, University of California San Diego, La Jolla, California 92093-0085 (Todd, M.D.) || Los Alamos National Laboratory, W-3, MS T080 Los Alamos, New Mexico, 87545 (Puckett, A.) |
Abstract | Low-power (<5 mW) white light extrinsic Fabry-Perot interferometric sensors offer micron-level absolute position measurement capability for devices under test (DUTs) over large (cm) displacements. Because the position is determined directly by demodulating the interferogram, the sensors are robust to most common sources of power fluctuations but sensitive to DUT velocity, which induces Doppler shifting. This shifting results in interferogram bias errors as large as 50–100 μm for DUT velocities as low as 0.1 mm/s. This paper derives a model for predicting this Doppler-induced bias in the interferogram and exploits the derived relationship with a dual-filter optical architecture to obtain simultaneously the DUT velocity and bias-corrected absolute displacement. This approach is successfully demonstrated with a prototype in lab bench experiment. (Approved for release; LA-UR #12-23426). |
Starting Page | 1 |
Ending Page | 4 |
File Size | 1277517 |
Page Count | 4 |
File Format | |
ISBN | 9781457717666 |
ISSN | 19300395 |
e-ISBN | 9781457717673 |
e-ISBN | 9781457717659 |
DOI | 10.1109/ICSENS.2012.6411128 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2012-10-28 |
Publisher Place | Taiwan |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Position measurement Cavity resonators Optical interferometry Doppler effect Optical sensors Velocity measurement |
Content Type | Text |
Resource Type | Article |
Subject | Electrical and Electronic Engineering |
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