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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Horibe, A. Kang-Wook Lee Okamoto, K. Mori, H. Orii, Y. Nishizako, Y. Suzuki, O. Shirai, Y. |
| Copyright Year | 2013 |
| Description | Author affiliation: IBM Res. - Tokyo, Kawasaki, Japan (Horibe, A.; Okamoto, K.; Mori, H.; Orii, Y.) || IBM Res. - Watson, Kawasaki, Japan (Kang-Wook Lee) || Namics Corp., Niigata, Japan (Nishizako, Y.; Suzuki, O.; Shirai, Y.) |
| Abstract | A new No Clean Flux (NCFx) material for large die packages was formulated, which has good wettability for area array lead-free solder bumps of 20 × 20 mm dies, and which doesn't leave any liquid residues under the die. In a reliability study on large die modules with a copper lid as a heat spreader, we confirmed no failures of electrical insulation during thermal and humidity tests. However, significant chip sidewall delamination was found at the early stage of a thermal cycle test. XPS analysis of the chip sidewall showed that an enhanced plasma treatment is necessary to make the sidewall clean compared with a typical water-cleaned reference sample. A CantiLever Beam (CLB) test to measure adhesion strength on chip sidewall also suggested that the $SiO_{2}$ surface (assumed to be the chip sidewall) treated with the enhanced plasma has stronger adhesion than the reference sample. |
| Sponsorship | IEEE Components, Packaging Manuf. Technol. Soc. |
| Starting Page | 688 |
| Ending Page | 693 |
| File Size | 1368620 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781479902330 |
| ISSN | 05695503 |
| e-ISBN | 9781479902323 |
| DOI | 10.1109/ECTC.2013.6575648 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-05-28 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Surface treatment Silicon Plasma temperature Adhesives Laminates |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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