NDLI: A new topology for fully differential amplifiers that enhances their tolerance to external disturbances

Content Provider	IEEE Xplore Digital Library
Author	Guoyuan Fu Mantooth, H.A. Jia Di
Copyright Year	2011
Description	Author affiliation: Computer Science and Computer Engineering Department, University of Arkansas, Fayetteville, 72701, USA (Jia Di) \|\| Electrical Engineering Department, University of Arkansas, Fayetteville, 72701, USA (Guoyuan Fu; Mantooth, H.A.)
Abstract	This paper presents a new topology for fully differential amplifiers (FDA). The unique feature of this topology is its three-stage cascaded structure with two dynamic common-mode feedback (CMFB) circuits in a single FDA. In comparison with traditional FDAs, this topology not only gains enhanced tolerance to device parameter variations caused by temperature, supply voltages, and other external disturbances, but also serves as a starting point to build three or more stages in a single FDA which helps achieve higher open loop gain. This topology has been successfully implemented in an FDA designed for extreme temperatures ranging from −180°C to 125°C using the 0.5µm SiGe BiCMOS process, and an FDA designed for extreme high temperature applications (up to 225°C) with the XI10-1µm Silicon-on-Insulator (SOI) process. In this paper, an FDA implementing this topology using 0.13µm CMOS 8RF-DM process is introduced, which is able to operate correctly across the temperature range of −180°C to 125°C and the supply voltage range of 0.72 V to 1.2 V (its nominal supply voltage is 1.2 V). Therefore, this new topology is a promising candidate for applications such as space exploration, remote control systems, bio-implantable devices, where high gain, wide temperature range, and better endurance to insufficient power supply are considered higher priority.
Starting Page	124
Ending Page	127
File Size	1115597
Page Count	4
File Format	PDF
ISBN	9781612841922
ISSN	2162755X
e-ISBN	9781612841939
e-ISBN	9781612841915
DOI	10.1109/ASICON.2011.6157138
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-10-25
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature measurement CMOS integrated circuits Phase measurement Robustness Immune system Switching circuits
Content Type	Text
Resource Type	Article

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