NDLI: Analysis of a noise canceling LNA using a Si2 OpenAccess based tool

Content Provider	IEEE Xplore Digital Library
Author	Alarcao, J.P. Oliveira, L.B. Oliveira, J.P. Santos-Tavares, R.
Copyright Year	2015
Description	Author affiliation: Dept. of Electr. Eng. (DEE), Univ. Nova de Lisboa (UNL), Caparica, Portugal (Alarcao, J.P.; Oliveira, L.B.; Oliveira, J.P.; Santos-Tavares, R.)
Abstract	Noise canceling techniques have been successfully applied to the design of modern multi-band RF-CMOS inductor-less receivers. However, low voltage supply requirements are imposing new design challenges which are pushing the operation of the MOS transistor into moderate or weak inversion, making the setup of closed sizing expressions a difficult task. This paper presents a Si2 OpenAccess based circuit analysis tool that can combines a symbolic equation extractor with the transistor parameters obtained from precise models, reinforcing the performance estimation while reducing the design time. The tool is applied for a wide-band Low Noise Amplifier (LNA). The results are validated by comparing them with values obtained from SpectreRF eletrical simulations using a 130 nm CMOS technology.
Starting Page	464
Ending Page	469
File Size	519323
Page Count	6
File Format	PDF
e-ISBN	9788363578077
DOI	10.1109/MIXDES.2015.7208564
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-06-25
Publisher Place	Poland
Access Restriction	Subscribed
Rights Holder	Department of Microelectronics and Computer Science, Lodz Univeristy of Technology
Subject Keyword	Solid modeling Noise CAD Si2 OpenAccess Noise measurement RF-CMOS Semiconductor device modeling Weak Inversion Modified Nodal Analysis EDA Tool Mathematical model Transistors Integrated circuit modeling
Content Type	Text
Resource Type	Article

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