NDLI: Analysis and design of a high performance Infrared detector readout circuit

Content Provider	IEEE Xplore Digital Library
Author	Meng Fanzhong Zhao Yiqiang Jiang Junwei Qu Ming Wang Gaofeng
Copyright Year	2009
Description	Author affiliation: ASIC Design Center, TianJin University, TianJin, 300072, China (Meng Fanzhong; Zhao Yiqiang; Jiang Junwei; Qu Ming; Wang Gaofeng)
Abstract	This paper presents a high performance readout circuit for Infrared detector. The circuit is composed of capacitor trans-impedance amplifier (CTIA) and correlation double sampling (CDS) circuit. The CTIA structure is used to convert the photo-current into voltage, and could obviously improve the readout accuracy of weak current signal. And the CDS structure is used to reduce the fixed pattern noise (FPN) of CTIA. Thus, the signal to noise ratio (SNR) of the designed readout circuit is improved. Meanwhile the small signal models of CTIA and CDS are established, and the converting accuracy and speed are fully discussed. The final chip is fabricated with Chartered 0.35um standard CMOS process, and occupies a 45µm×400µm area. Under the condition that the power supply is 3.3 V, operation of the fabricated chip is verified, and the output dynamic range is measured as 0.3 to 2.48V. Testing results show that the linearity of CTIA is 99%, and that the readout accuracy is 10-bit, while the detecting current varies from 20pA to 10nA.
Starting Page	605
Ending Page	608
File Size	518437
Page Count	4
File Format	PDF
ISBN	9789810824686
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-12-14
Publisher Place	Singapore
Access Restriction	Subscribed
Rights Holder	NANYANG TECHNOLOGICAL UNIV
Subject Keyword	Infrared detectors Capacitors Noise reduction FPN Semiconductor device modeling CDS CTIA Voltage Converting accuracy Sampling methods Performance analysis Circuit noise Signal design Signal to noise ratio
Content Type	Text
Resource Type	Article

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