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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Salmi, A.H. Merilainen, A. Haeggstrom, E. Torkkeli, M. Serimaa, R. |
| Copyright Year | 2007 |
| Description | Author affiliation: Univ. of Helsinki, Helsinki (Salmi, A.H.; Merilainen, A.; Haeggstrom, E.) |
| Abstract | We continue our quest to determine localized micro- elasticity by combining a standing ultrasonic wave pattern and SAXS X-ray diffraction $(CuK_{alpha}$ 1.54 Aring) to map the local elastic modulus. This was done in 20times20times1.5 $mm^{3}$ dry Scots pine (Pinus Sylvestris L) soft wood and high-density polyethene (HDPE), acting as homogenized wood phantom samples. An Atmel Atmega 8515 (8 bit, 16 MHz) microprocessor launches and upholds a resonant lambda/2 wave pattern in the radial wood direction using a 100 Hz feedback loop. By varying the transmitted ultrasonic power, it is possible to alter the local stress within the volume probed by the 1 $mm^{2}$ X-ray beam. The local strain in unit crystals is determined from changes in the width and position of the X-ray diffraction peaks. The results indicate that the method is applicable for localized quantitative elasticity mapping. |
| Starting Page | 54 |
| Ending Page | 57 |
| File Size | 589849 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424413836 |
| ISSN | 10510117 |
| DOI | 10.1109/ULTSYM.2007.27 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-10-28 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Ultrasonic imaging Elasticity X-ray diffraction Imaging phantoms Microprocessors Resonance Feedback loop Stress Capacitive sensors Crystals |
| Content Type | Text |
| Resource Type | Article |
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