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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ning-Yuan Wang Shih-Ying Chiang Tsung-Lin Chou Zun-Hao Shih Hwen-Fen Hong Kuo-Ning Chiang |
| Copyright Year | 2010 |
| Description | Author affiliation: Department of Power Mechanical Engineering, National Tsing Hua University, China (Ning-Yuan Wang; Shih-Ying Chiang; Tsung-Lin Chou) || Institute of Nuclear Energy Research (INER), Atomic Energy Council, Taiwan (Zun-Hao Shih; Hwen-Fen Hong) |
| Abstract | Based on the standard of International Electrotechnical Commission (IEC) on the thermal cycling test for a high concentration photovoltaic (HCPV) module, frequent current input must be applied when oven temperature exceeds 25°C. As such, the junction temperature of a solar cell chip would oscillate due to the joule heating effect. However, the fluctuation of the junction temperature might be one of the reliability issues being faced by an HCPV thermal cycling test. The process of getting the actual junction temperature is necessary before its mechanical behavior is discussed. In this study, the forward voltage method was adopted to measure and monitor the time-dependent junction temperature of an HCPV module. In addition, a detailed finite element (FE) model of the HCPV module with adapted input power and suitable boundary condition was established, analyzed, and validated with the experimental data. Results on the finite element analysis (FEA) were consistent with the experimental data. Hence, we conclude that the simulation of the FE model adopted in this research can be effectively used to simulate the transient thermal characteristics of an HCPV module, subjected to coupled power and thermal cycling test conditions. |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 657396 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424453429 |
| ISSN | 10879870 |
| e-ISBN | 9781424453436 |
| DOI | 10.1109/ITHERM.2010.5501253 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-06-02 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Transient analysis Photovoltaic cells Testing Temperature IEC standards Finite element methods Photovoltaic systems Solar power generation Ovens Solar heating power cycling test HCPV module solar cell finite element transient thermal analysis thermal cycling test |
| Content Type | Text |
| Resource Type | Article |
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