NDLI: Embedded instruments for enhancing dependability of analogue and mixed-signal IPs

Content Provider	IEEE Xplore Digital Library
Author	Jinbo Wan Kerkhoff, H.G.
Copyright Year	2015
Description	Author affiliation: Testable Design & Test of Integrated Syst. Group (TDT), Univ. of Twente, Enschede, Netherlands (Jinbo Wan; Kerkhoff, H.G.)
Abstract	The idea of an embedded instrument (EI) is to embed some form of test and measurement into silicon to characterize, debug and test chips. The concept of the EI is different from build-in self test (BIST) and other kinds of monitors by the fact that embedded instruments can provide the user with rich and detailed information with respect to the performances of the target, not just a true/false indication. In this paper, two embedded instruments for analogue and mixed-signal IPs focusing on dependability applications are introduced. They are the EI for measuring MOS transistors' threshold voltage and the EI for testing OpAmps' gain and offset. Measurements as well as simulation results are provided to validate these EIs and show their efficiency in monitoring the ageing of analogue and mixed-signal IPs in their life time, and enable the path to enhance dependability.
Starting Page	1
Ending Page	4
File Size	386741
Page Count	4
File Format	PDF
ISBN	9781479988938
DOI	10.1109/NEWCAS.2015.7181979
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-06-07
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Current measurement Voltage measurement Semiconductor device measurement Reliability System-on-chip MOSFET
Content Type	Text
Resource Type	Article

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