NDLI: Error-Model Driven Analysis of Quantum Circuits Reliability

Content Provider	IEEE Xplore Digital Library
Author	Boncalo, O. Udrescu, M. Prodan, L. Vladutiu, M. Amaricai, A.
Copyright Year	2008
Description	Author affiliation: Comput. Sci. & Eng. Dept., "Politeh." Univ. of Timisoara, Odense (Boncalo, O.; Udrescu, M.; Prodan, L.; Vladutiu, M.; Amaricai, A.)
Abstract	This paper presents a flexible VHDL simulation framework, meant to analyze the link between the adopted noise model and the quantum circuit fidelity. The key ingredient is the use of fault injection components (i.e. mutants and saboteurs), which are tailored according to the noise model. The evaluation of quantum fault tolerant (FT) schemes is dominated by analytical studies, mostly restricted to independent probabilistic faults. The model adopted herein addresses general noise, which includes: probabilistic faults, amplitude errors, depolarization, amplitude damping, and phase damping. This way, we show that a rigorous CAD analysis for lower levels of FT schemes can be performed. The results can then be used to tune up simulation or analytical parameters for the higher levels. The target of our simulations is a particular quantum network, responsible for generating and verifying the encoded ancilla state $\|^{0}rang_{F}$ .
Starting Page	625
Ending Page	628
File Size	361047
Page Count	4
File Format	PDF
ISBN	9781424421039
DOI	10.1109/NANO.2008.187
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-08-18
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Noise Integrated circuit modeling Circuit faults Logic gates Damping Fault location Solid modeling
Content Type	Text
Resource Type	Article

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