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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yilun Luo Jiangbo Zhang Ning Xi Hongzhi Chen King Wai-Chiu Lai Fung, C.K.-M. Tarn, T.J. |
| Copyright Year | 2008 |
| Description | Author affiliation: Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI (Yilun Luo; Jiangbo Zhang; Ning Xi; Hongzhi Chen; King Wai-Chiu Lai; Fung, C.K.-M.) |
| Abstract | For traditional semiconducting materials, band gap is a unique characteristic which limits the material's applications and device's performance. The capability of on-chip adjusting semiconducting material's band gap is extremely important in manufacturing electronic devices. As a one-dimensional nano material with excellent electrical properties, carbon nanotube (CNT) has a band gap determined by the circumferential quantum confinement, which depends on the tube diameter. Hence for a multi-walled carbon nanotube (MWCNT), the band gap can be on-chip adjusted by electrically removing its outer carbon shells. This paper discusses a real-time control method for controlling the MWCNT band gap adjusting process. A state space model was developed based on the quantum model for electron transport inside a nanotube. The rapid change of the system state, which represents the occurrence of electrical breakdown, can be observed using robust fault detection technique for breakdown process control. Experimental results show that the breakdown control system can effectively convert metallic MWCNTs to semiconducting MWCNTs and further adjust the band gap, which is especially important for optical detection to reduce the dark current and enhance the photo current. |
| Starting Page | 183 |
| Ending Page | 186 |
| File Size | 421090 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424421039 |
| DOI | 10.1109/NANO.2008.60 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-08-18 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electric breakdown Photonic band gap Carbon nanotubes Current measurement Process control Electric potential Carbon |
| Content Type | Text |
| Resource Type | Article |
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