NDLI: Dichromatic spectral measurement circuit in vanilla CMOS

Content Provider	IEEE Xplore Digital Library
Author	Fasnacht, D.B. Delbruck, T.
Copyright Year	2007
Description	Author affiliation: Inst. of Neuroinformatics, UNI-ETH, Zurich (Fasnacht, D.B.; Delbruck, T.)
Abstract	The circuit described in this paper uses a "verta-color" stacked two-diode structure to measure relative long and short wavelength spectral content. The p-type source-drain to nwell forms the top diode and the nwell-psubstrate diode forms the bottom diode. The circuit output is a digital PWM signal whose frequency encodes absolute intensity and whose duty cycle encodes the relative photodiode current. This signal is formed by a self-timed circuit that alternately discharges the top and bottom photodiodes. This circuit was fabricated in a standard 3M 2P 0.5 mum CMOS process. Monochromatic stimulation shows that the duty cycle varies between 50% and 7% as the photon wavelength is varied between 400 nm to 750 nm. The output frequency is 150 Hz at incident irradiance of 1.7 $W/m^{2}.$ Chip-to-chip variation of PWM duty cycle and frequency is about 1% measured over 5 chips. Power consumption is 20 muW. A modified version of this circuit could form the basis for simple color vision sensors built in widely-available vanilla CMOS.
Starting Page	3091
Ending Page	3094
File Size	999996
Page Count	4
File Format	PDF
ISBN	1424409209
DOI	10.1109/ISCAS.2007.378062
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-05-27
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuits Pulse width modulation Wavelength measurement Diodes Photodiodes Fault location CMOS process Frequency measurement Semiconductor device measurement Energy consumption
Content Type	Text
Resource Type	Article

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