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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Fukuzawa, H. Hara, M. Yuasa, H. Fuji, Y. |
| Copyright Year | 1965 |
| Abstract | Nanostructure of current-perpendicular-to-plane giant magnetoresistance (CPP-GMR) films with a current-confined-path nano-oxide layer (CCP-NOL) is analyzed by high-resolution transmission electron microscope (HRTEM) and three-dimensional atom probe (3DAP). By HRTEM analysis, it is found that the CCP is formed on the center of the grain of a pinned layer. By 3DAP analysis, the grain size of a free layer can be visually detected and its size is about 5-10 nm. The grain of a free layer is well aligned with a CCP, suggesting that the decrease of the grain size of a pinned layer is effective for increasing the number of the CCPs per unit area. Moreover, by using a 3DAP image, the density of the CCPs per unit area can be derived. As a result, it is clearly shown that the density of the CCPs per unit area increases with decreasing resistance area product (RA) , which cannot be obtained from HRTEM analysis. By combining HRTEM result and 3DAP result, the nanostructure of the CCP can be clarified, and the decrease of the grain size of a pinned layer and the decrease of RA are preferable for an extremely small element size for a higher-density recording head. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 3580 |
| Ending Page | 3583 |
| Page Count | 4 |
| File Size | 1007417 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 44 |
| Issue Number | 11 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-11-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Substrates Magnetic analysis Probes Grain size Transmission electron microscopy Atomic layer deposition Testing Semiconductor films Giant magnetoresistance Magnetic force microscopy spin-valve Atom probe CPP-GMR current-confined-path |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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