NDLI: Magnetic Behavior of Ni/Cu Multilayer Nanowire Arrays Studied by First-Order Reversal Curve Diagrams

Content Provider	IEEE Xplore Digital Library
Author	Beron, F. Carignan, L.-P. Menard, D. Yelon, A.
Copyright Year	1965
Abstract	Arrays of Ni/Cu multilayer nanowires were fabricated by electrodeposition into alumina templates (pore diameter = 175 nm, interpore distance = 300 nm), with an Ni disc thickness between 20 and 50 nm, and a Cu thickness between 10 and 35 nm. Vector major hysteresis loops were measured with an out-of-plane (along the nanowire axis) and inplane (perpendicular to the nanowire axis) applied field. During the magnetization reversal, we did not observe any net component of transverse magnetization (M_y) , perpendicular to the applied field H_x. Extrapolated first-order reversal curve (FORC) diagrams were measured, out-of-plane and inplane. While the major hysteresis loops of all arrays have similar shapes, their FORC diagrams reveal distinct patterns, suggesting different magnetic behavior. The magnetic anisotropy can be controlled by the ratio of Cu to Ni thickness, the nanowire axis becoming harder as the ratio increases. In the out-of-plane direction, the maximum interaction field is proportional to the Ni thickness. The FORCs show evidence of a large coercive field distribution, which we attribute to the smaller interaction fields in the nanodiscs along the edges of the samples. In the inplane direction, depending upon the easy axis direction, there can be a mixture of nanodiscs reversed by coherent and incoherent rotation, or by incoherent rotation only.
Sponsorship	IEEE Magnetics Society
Starting Page	2745
Ending Page	2748
Page Count	4
File Size	546466
File Format	PDF
ISSN	00189464
Volume Number	44
Issue Number	11
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-11-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Magnetic multilayers Magnetic anisotropy Perpendicular magnetic anisotropy Magnetic hysteresis Magnetization reversal Magnetic field measurement Thickness control Nanostructures Magnetic analysis Scanning electron microscopy vector hysteresis curves First-order reversal curve (FORC) interaction field magnetization reversal multilayer nanowire nanowire array
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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