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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hoshino, K. Hoshiya, H. |
| Copyright Year | 1965 |
| Abstract | We investigated current-perpendicular-to-plane giant magnetoresistance (CPP-GMR) with current screen layer of various Co-Fe compositions. The resistance-area product (RA) and the change in the resistance-area product (DeltaRA) increased with increasing Fe compositions in the current screen layer up to 25 at.%. However, they were very low at Fe compositions above 50 at.%. It seemed that the boundaries of the RA and Delta RA dependences on Co-Fe composition were similar to that of the Co-Fe composition between fcc and bcc structures. Based on transmission electron microscopic observations, the current screen layer composed of Co90Fe10 was formed uniformly, and it had an epitaxially crystalline structure. On the other hand, the current screen layer composed of Co50Fe 50 was formed with a large degree of roughness, and it had a complicated crystalline structure. This suggests that a uniform current screen layer with an epitaxially crystalline structure is important to enhance the MR ratio for CPP-GMR |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 2453 |
| Ending Page | 2455 |
| Page Count | 3 |
| File Size | 921731 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 42 |
| Issue Number | 10 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-10-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Iron Crystallization Magnetic field measurement Giant magnetoresistance Transmission electron microscopy Magnetic confinement Oxidation Magnetic films Laboratories Magnetic sensors spin-valves Co-Fe composition CPP-GMR current screen layer |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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