NDLI: Current limitation with bulk Y-Ba-Cu-O

Content Provider	IEEE Xplore Digital Library
Author	Tixador, P. Porcar, L. Floch, E. Buzon, D. Isfort, D. Bourgault, D. Chaud, X. Tournier, R.
Copyright Year	2002
Abstract	The fault current limiter is a very attractive device for electric networks. Meander pattern conductors cut from bulk melt textured YBCO were studied for this application. The meanders are put in series and/or in parallel to match the required current and voltage. The YBCO materials are attractive because they show a very effective limitation with a relative low volume (high engineering current density and normal state resistivity). However, they are sensitive to hot spots. To avoid these destructive hot spots the operating temperature is chosen very close to the critical temperature (above 90 K). This temperature range is reached using a pressurised liquid nitrogen bath. Working close to Tc has two major advantages. The first is reduced values of Jc which limit the power dissipation. The Jc can be matched by changing the pressure on the nitrogen bath. The second is that the proximity of the normal state is favourable for homogeneous quenches along the whole meander as it can be experimentally recorded. Results obtained on single meanders and on the whole assembly are reported under steady state operation as well as during current limitation. Forty three meanders in series limited the current to 740 A (11 000 A unlimited value) under 1 kV.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	2034
Ending Page	2037
Page Count	4
File Size	550767
File Format	PDF
ISSN	10518223
Volume Number	11
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Yttrium barium copper oxide Temperature distribution Temperature sensors Conducting materials Nitrogen Fault current limiters Voltage Current density Conductivity Power dissipation
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Influence of microstructure on power dissipation in bulk Y-Ba-Cu-O structures

Initial quench development in uniform Au/Y-Ba-Cu-O thin films [superconducting fault current limiters]

Quench properties of Y-Ba-Cu-O films after overpowering quenches [superconducting fault current limiters]

Current limiting performance by single grained Y-Ba-Cu-O superconducting rings

Critical current of Y-Ba-Cu-O bulk current leads

Measurement of transport critical current of Y-Ba-Cu-O using an inductive method

Improved Flux Pinning in Y–Ba–Cu–O Superconductors Containing Niobium Oxide

Resistive fault current limiters with HTSC-measurements and simulation

Investigation of photoresponse in Y-Ba-Cu-O epitaxial films

Current limitation with bulk Y-Ba-Cu-O

Similar Documents

Influence of microstructure on power dissipation in bulk Y-Ba-Cu-O structures

Initial quench development in uniform Au/Y-Ba-Cu-O thin films [superconducting fault current limiters]

Quench properties of Y-Ba-Cu-O films after overpowering quenches [superconducting fault current limiters]

Current limiting performance by single grained Y-Ba-Cu-O superconducting rings

Critical current of Y-Ba-Cu-O bulk current leads

Measurement of transport critical current of Y-Ba-Cu-O using an inductive method

Improved Flux Pinning in Y–Ba–Cu–O Superconductors Containing Niobium Oxide

Resistive fault current limiters with HTSC-measurements and simulation

Investigation of photoresponse in Y-Ba-Cu-O epitaxial films

Current limitation with bulk Y-Ba-Cu-O