NDLI: Capacitance as a probe of high angle grain boundary transport in oxide superconductors

Content Provider	IEEE Xplore Digital Library
Author	Tarte, E.J. McBrien, P.F. Ransley, J.H.T. Hadfield, R.H. Inglessi, E. Booij, W.E. Burnell, G. Blamire, M.G. Evetts, J.E.
Copyright Year	2002
Abstract	We report a series of studies of grain boundary (GB) capacitance for YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) films grown on SrTiO/sub 3/ (STO) bicrystal substrates. By varying the film thickness and the width of the track containing the GB, we find that the substrate makes no contribution to the capacitance measured using Fiske resonances or hysteresis in most cases. This is due to the frequency dependence of the dielectric properties of SrTiO/sub 3/. We have also found that GB capacitance per unit area c/sub GB/ correlates with the resistance-area product R/sub n/A. For our own GBs and GBs reported in the literature the data is is consistent with c/sub GB//spl prop/(R/sub n/A)/sup -1/. We attribute this to variations in GB barrier properties, which reduce the active area, whilst maintaining locally the transport mechanism as tunneling.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	418
Ending Page	421
Page Count	4
File Size	461517
File Format	PDF
ISSN	10518223
Volume Number	11
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Probes Grain boundaries Dielectric substrates Yttrium barium copper oxide Capacitance measurement Dielectric measurements Electrical resistance measurement Thickness measurement Resonance Hysteresis
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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