NDLI: Influence of B-dependence of critical current density on magnetic shielding performance of MPMG-YBCO plate

Content Provider	IEEE Xplore Digital Library
Author	Kamitani, A. Hasegawa, K. Ohshima, S. Yokono, T.
Copyright Year	2002
Abstract	The magnetic shielding performance of the MPMG-YBCO plate is investigated numerically by assuming the flux-flow and flux-creep model as the J-E constitutive relation. The magnetic-field dependence of the critical current density and the flow resistivity is also taken into consideration through the Kim model and the Bardeen-Stephan model. Under these assumptions, the damping coefficients and the shielding factors are calculated as functions of the frequency and the amplitude of the applied AC magnetic field. The results of computations show that an increase in the frequency will enhance the shielding performance of the MPMC-YBCO plate. In addition, there exists the lowest limit of the frequency, above which the shielding performance is saturated, and the limit increases with the amplitude of the applied magnetic field. Furthermore, it turns out that the magnetic shielding performance is hardly influenced by the magnetic-field dependence of the critical current density.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	2256
Ending Page	2259
Page Count	4
File Size	445286
File Format	PDF
ISSN	10518223
Volume Number	11
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Critical current density Magnetic shielding High temperature superconductors Magnetic materials Telephony Frequency Current density Yttrium barium copper oxide Magnetic flux Saturation magnetization
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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