NDLI: Imaging defects in Cu-clad NbTi wire using a high-T/sub c/ scanning SQUID microscope

Content Provider	IEEE Xplore Digital Library
Author	Fleet, E. Gilbertson, A. Chatraphorn, S. Tralshawala, N. Weinstock, H. Wellstood, F.C.
Copyright Year	2002
Abstract	We have used a sensitive magnetic microscope based on the dc Superconducting Quantum Interference Device (SQUID) to examine room-temperature samples of Cu-clad NbTi wire. Our SQUID microscope allows the wire (in air at room temperature) to be brought to within about 0.05 mm of the SQUID, although typically the separation is 0.3-0.4 mm. The wires have round or rectangular cross-sections and are about 2 mm across. With the wire aligned parallel to the x-direction in the x-y scanning plane we apply currents of a few mA through the wire at a frequency of a few hundred Hz, and image the x-component of the magnetic field. Defects cause a redistribution of current and corresponding features in the magnetic field image. We show images of wires, and discuss the advantages of using the parallel component of the field.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	215
Ending Page	218
Page Count	4
File Size	442205
File Format	PDF
ISSN	10518223
Volume Number	11
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Niobium compounds Titanium compounds SQUIDs Magnetic fields Micromagnetics Superconducting devices Superconducting filaments and wires Interference Microscopy Temperature sensors
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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