NDLI: Relationship between the surface resistance and crystal orientation of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin film

Content Provider	IEEE Xplore Digital Library
Author	Ohshima, S. Kusunoki, M. Mukaida, M. Suzuki, T. Chibai, K. Inadomaru, M. Takano, Y.
Copyright Year	2002
Abstract	We have examined the relationship between in-plane orientation, grain size, fluctuation of grain axis and surface resistance of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) films, The surface resistance of YBCO films with a mixture of [100] and [110] in-plane grains was larger than that of the films with perfect in-plane orientation. The behavior of surface resistance could be explained by the degree of grain boundaries of [100] and [110] in-plane orientation. The surface resistance of YBCO films was proportion to the fluctuation of grain axis. It was also proven that surface resistance of high-temperature superconductors is affected by the critical current.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	3493
Ending Page	3496
Page Count	4
File Size	374178
File Format	PDF
ISSN	10518223
Volume Number	11
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Surface resistance Yttrium barium copper oxide Sputtering High temperature superconductors Grain size Transistors Fluctuations Superconducting thin films Superconducting films Critical current
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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