NDLI: Non-linear microwave response of HTS thin films: a comparison of intermodulation and conventional measurements

Content Provider	IEEE Xplore Digital Library
Author	Ling Hao Gallop, J. Purnell, A. Cohen, L. Thiess, S.
Copyright Year	2002
Abstract	The non-linear microwave response of HTS thin films is a crucial issue for applications of the cuprates in future communications technologies. We report comparisons of nonlinear characterisation measurements made by two different techniques. The first involves two-tone intermodulation measurements, for which the HTS thin films are incorporated into a high Q resonant structure and two spectrally pure tones are injected within the resonator bandwidth. The second consists of a conventional high power steady-state parallel-plate resonator measurement of the non-linear response of Z/sub s/(H/sub rf/). Two very different HTS thin film samples are examined and simple physical models, involving grain boundary effects or film heating, are used to relate the intermodulation and power dependent impedance results to properties of the HTS thin film.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	3411
Ending Page	3414
Page Count	4
File Size	428757
File Format	PDF
ISSN	10518223
Volume Number	11
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	High temperature superconductors Transistors Electromagnetic heating Communications technology Q measurement Resonance Bandwidth Steady-state Power measurement Grain boundaries
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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