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Content Provider | IEEE Xplore Digital Library |
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Author | Cheng Ma Wei Shi Mengxia Li Huaimeng Gui Nana Hao Pengbo Xue |
Copyright Year | 1963 |
Abstract | The current filament phenomena in high gain gallium arsenide (GaAs) photoconductive semiconductor switches (PCSS) always draw a significant influence on the lifetime of the devices. This paper presents a study on the influence of the current filament over the material properties and output characteristics of the GaAs PCSS. The working principle of the current filaments has been analyzed and it is shown that the performance of GaAs PCSS degrades due to the heating effects of the current filaments. It is observed that the heating effect of current filament reduces the dark resistivity of the GaAs material; furthermore, it gradually damages electrode of PCSS, leading to the breakdown of PCSS. This paper presents the relationship between the turn-ON process and damage of the PCSS. |
Sponsorship | IEEE Electron Devices Society |
Starting Page | 2432 |
Ending Page | 2436 |
Page Count | 5 |
File Size | 1551515 |
File Format | |
ISSN | 00189383 |
Volume Number | 61 |
Issue Number | 7 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2014-01-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Gallium arsenide Optical switches Electric breakdown Conductivity Heating Electrodes semiconductor. Current filaments EL2 level gallium arsenide (GaAs) semiconductor |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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