NDLI: Thickness Dependence of the Critical-Current Density and its Relation to Near-Interface Crystal Imperfections in Fluorine-Free-MOD YBCO Films

Content Provider	IEEE Xplore Digital Library
Author	Matsui, H. Tsukada, K. Tsuchiya, T. Sohma, M. Yamaguchi, I. Manabe, T. Kumagai, T.
Copyright Year	2002
Abstract	We have studied the thickness (t) dependence of the critical-current density (J_c) of epitaxial YBCO films grown by fluorine-free MOD to understand the origin of strong depletion of J_c by film thickening. We have grown more than thirty samples with t varied from 0.2 to 1.4 μm, and obtained a detailed J_c-vs-t relation with good statistics. It was found that J_c is strongly suppressed by increasing t, and the rate of suppression is changed at around t=0.4 μm. Numerical fitting of the data revealed that the J_c-t curve above 0.4 μm is well reproduced by a t-inverse-type function. We discuss implications of these observations comparing with cross-sectional TEM results, which show a characteristic vertical distribution of microstructural disorder. This study is based on a half-photolytic F-free MOD process using a uv-excimer lamp which we have recently developed for fabrication of micron-order-thick epitaxial YBCO films.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	2933
Ending Page	2936
Page Count	4
File Size	1440357
File Format	PDF
ISSN	10518223
Volume Number	21
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Yttrium barium copper oxide Epitaxial growth Substrates Superconducting epitaxial layers X-ray scattering Crystals Conductors YBCO Excimer lamp high-temperature superconductors MOD process
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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