NDLI: Cryogenic Test-Bed Applied to 9 K NbN RSFQ Devices Operation

Content Provider	IEEE Xplore Digital Library
Author	Aurino, M. Baggetta, E. Bouat, S. Michal, V. Renaud, D. Bornier, C. Laine, M. Villegier, J.
Copyright Year	2002
Abstract	NbN RSFQ circuits operating at 9 K reduce the cooling constraints especially for portable, remote, telecoms or medical imaging applications. We have developed a test-bed to study the operating temperature of the various mixed RF and digital circuit blocks of NbN `HyperSCAN' project test vehicle 1 cm² chips. The use of a widespread helium cryostat (`Orange-ILL') allows us to stabilize the chip temperature in the range 2.9 K-20 K with thermal oscillations lower than 0.1 K. The chip is mounted on a PCB and shielded from the external field: the PCB provides a multi-connection packaging used in order to study temperature and frequency operation of 30 GHz NbTiN CPW filters, RSFQ gates, analog SQUID and NbN/TaN/NbN SNS junctions arrays. The comparison between electrical simulations and tests is made on flexible, ~ 56 cm long, micro-strip line ribbon cable carrying 32 signals each including bias lines, in the range of DC-3 GHz, combined with 4 semi-rigid ~ 40 GHz coaxial cables. By removing spurious resonances, it is expected to take full benefit of the large bandwidth, low insertion loss and low thermal conductivity of the set-up. We emphasis on the flexibility, large yield, reliability and reduced cost of such packaging coupled to He cooling exchanger for applying to testers and to future 9 K NbN multi-ADC green and remote systems when only low electrical power sources are available.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	904
Ending Page	907
Page Count	4
File Size	338610
File Format	PDF
ISSN	10518223
Volume Number	21
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Junctions Power cables Temperature measurement Superconducting cables Temperature distribution Helium Niobium superconducting devices Cryogenic packaging Josephson circuits RSFQ
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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