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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kajitani, H. Ishiyama, A. Koizumi, N. Murakami, H. Nakajima, H. |
| Copyright Year | 2002 |
| Abstract | The critical current of a cable-in-conduit conductor (CICC) for an ITER TF coil was measured using the SULTAN test facility. It was found that a non-uniform current distribution was established due to a non-uniform joint resistance. To evaluate the critical current performance accurately, we used a solder-filled joint. To study the effect of this solder-filled joint on the current distribution, we used a lumped circuit model and a distributed circuit model for the conductor and the joint, respectively, and combined the two to develop a new analysis model. This enabled us to solve the distributed circuit equation using only a few iterations, resulting in considerable reduction of the calculation time. Simulation results showed that, although the current distribution was non-uniform due to the ramping current, it improved at the current sharing temperature. This indicated that the solder-filled joint effectively improved the current distribution. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 1964 |
| Ending Page | 1968 |
| Page Count | 5 |
| File Size | 420088 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 21 |
| Issue Number | 3 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Conductors Current distribution Joints Integrated circuit modeling Mathematical model Resistance Critical current current transfer CICC critical current current distribution |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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