NDLI: Analysis of Bulk and Thin Film Model Samples Intended for Investigating the Strain Sensitivity of Niobium-Tin

Content Provider	IEEE Xplore Digital Library
Author	Mentink, M.G.T. Anders, A. Dhalle, M.M.J. Dietderich, D.R. Godeke, A. Goldacker, W. Hellman, F. ten Kate, H.H.J. Putnam, D. Slack, J.L. Sumption, M.D. Susner, M.A.
Copyright Year	2002
Abstract	Bulk samples and thin films were fabricated and characterized to determine their suitability for studying the effect of composition and morphology on strain sensitivity. Heat capacity and resistivity data are used to determine the critical temperature distribution. It is found that all bulk samples contain stoichiometric Nb₃Sn regardless of their nominal Nb to Sn ratio. Furthermore, in bulk samples with Cu additions, a bi-modal distribution of stoichiometric and off-stoichiometric Nb-Sn is found. Thus the nominally off-stoichiometric bulk samples require additional homogenization steps to yield homogeneous off-stoichiometric samples. A binary magnetron-sputtered thin film has the intended off-stoichiometric Nb-Sn phase with a mid-point critical temperature of 16.3 K. This type of sample is a suitable candidate for investigating the strain sensitivity of A15 Nb_1-βSn_β, with 0.18 <; β <; 0.25. The strain sensitivity of Nb-Sn as a function of composition and morphology is important for an in-depth understanding of the strain sensitivity of composite Nb₃Sn wires.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	2550
Ending Page	2553
Page Count	4
File Size	409105
File Format	PDF
ISSN	10518223
Volume Number	21
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Heating Temperature measurement Strain Niobium Tin Conductivity Copper thin film Bulk composition heat capacity ${\rm Nb}_{3}{\rm Sn}$ strain sensitivity superconductor
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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Analysis of Bulk and Thin Film Model Samples Intended for Investigating the Strain Sensitivity of Niobium-Tin

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