NDLI: Coarse <formula formulatype=inline><tex Notation=TeX>${rm Nb}_{3}{rm Sn}$</tex></formula> Grain Formation and Phase Evolution During the Reaction of a High Sn Content Internal Tin Strand

Content Provider	IEEE Xplore Digital Library
Author	Scheuerlein, C. Di Michiel, M. Arnau, G. Flukiger, R. Buta, F. Pong, I. Oberli, L. Bottura, L.
Copyright Year	2002
Abstract	The formation of coarse Nb₃Sn grains in Internal Tin (IT) strands has been studied at the example of a prototype strand with high Sn content. Metallographic examination revealed that the comparatively low critical current density (J_c) of this strand is partly due to the formation of a significant fraction of coarse grained Nb₃Sn at the periphery of the individual filaments within the subelements. The phase evolution during the reaction heat treatment has been determined in situ by high energy synchrotron X-ray diffraction as well as ex situ by Energy Dispersive X-ray Spectroscopy in a Scanning Electron Microscope (SEM) in order to identify the conditions under which the coarse grains form. Similar to what is observed in the tubular type strands, Nb₃Sn coarse grain formation occurs in the filament areas that had first been transformed into NbSn₂ and Nb₆Sn₅, prior to Nb₃Sn formation, and it accounts for an estimated Jc reduction of roughly 20%. The amount of Cu-Nb-Sn and NbSn₂ that is formed during the heat treatment can be reduced by increasing the temperature ramp rate, while the amount of Nb₆Sn₅ formed appears to be hardly influenced by the different heat treatments that have been tested.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	2554
Ending Page	2558
Page Count	5
File Size	1369427
File Format	PDF
ISSN	10518223
Volume Number	21
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Niobium Tin Temperature measurement X-ray diffraction Heat treatment Diffraction Scanning electron microscopy superconducting wires and filaments ${\rm Nb}_{3}{\rm Sn}$
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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