NDLI: A detection of defect in diamond images using 2-D haar wavelet transform

Content Provider	IEEE Xplore Digital Library
Author	Markchai, P. Kiattisin, S. Leelasantitham, A.
Copyright Year	2010
Description	Author affiliation: Computer and Multimedia Engineering, School of Engineering, University of the Thai Chamber of Commerce, 126/1, Vibhavadee-Rangsit Road, Dindaeng, Bangkok 10400, Thailand (Markchai, P.; Kiattisin, S.; Leelasantitham, A.)
Abstract	This paper presents a detection of defect in diamond images using 2-D wavelet transform for helping to solve problems in diamond quality examination by photographs. The wavelet is able to examine images in a form of texture, graph and histogram which this method is cable to take these values to analyze the differences between defective and flawless diamond because the image of each diamond have different textures. There are more or less the texture depending on many factors such as square cut and flaw. With this approach, the examining process of diamond detection is reduced then it can be done faster. As a result of 2-D wavelet transform, there are 30 diamond images for testing which all images can be verified for the flaw in diamond images.
Starting Page	831
Ending Page	834
File Size	947746
Page Count	4
File Format	PDF
ISBN	9781424474530
e-ISBN	9788993215021
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-10-27
Publisher Place	Korea (South)
Access Restriction	Subscribed
Rights Holder	IEEE International Conference on Control & Automation
Subject Keyword	Fourier transforms Diamond Images Wavelet analysis Diamond-like carbon Discrete wavelet transforms Texture 2-D wavelet transform Testing
Content Type	Text
Resource Type	Article

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