NDLI: Power dissipation, variations and nanoscale CMOS design: Test challenges and self-calibration/self-repair solutions

Content Provider	IEEE Xplore Digital Library
Author	Bhunia, S. Roy, K.
Copyright Year	2007
Description	Author affiliation: Dept of EECS, Case Western Reserve Univ., Cleveland, OH (Bhunia, S.)
Abstract	In the nanometer technology regime, power dissipation and process parameter variations have emerged as major design considerations. These problems continue to grow with leakage power becoming a dominant form of power consumption. On the other hand, variations in the device parameters, both systematic and random, translate into variations in circuit parameters like delay and leakage, leading to loss in parametric yield. Numerous design techniques have been investigated for both logic and memory circuits to address the growing issues with power and variations. Low-power and process-tolerant designs, however, impose new test challenges and may even have conflicting requirements for test - affecting delay fault coverage, $I_{DDQ}$ testability, parametric yield, and even stuck-at tests. Hence, there is a need to consider test and yield, while designing for low-power and robustness under variations. In this paper, we provide an overview of major low-power and variation-tolerant design techniques; discuss related test issues and focus on effectiveness of self-calibration/self-repair solutions to maintain high yield while achieving low power dissipation.
Starting Page	1
Ending Page	10
File Size	396825
Page Count	10
File Format	PDF
ISBN	9781424411276
ISSN	10893539
DOI	10.1109/TEST.2007.4437659
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-10-21
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Power dissipation Automatic testing Circuit testing Delay CMOS technology Energy consumption Logic devices Logic design Logic circuits Process design
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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