NDLI: Analyzing and addressing the impact of test fixture relays for multi-gigabit ATE I/O characterization applications

Content Provider	IEEE Xplore Digital Library
Author	Moreira, J. Barnes, H. Hoersch, G.
Copyright Year	2007
Abstract	Relays are some of the most frequently used components on test fixtures for automated test applications. With data-rates of current I/O interfaces already reaching 5 Gbps and beyond in desktop applications and expected to continue to increase, test engineers must make the decision to continue using relays on the high-speed signal lines, or remove the relays from the test fixture signal paths and sacrifice the flexibility they provide. This paper presents some results and guidelines on using relays in test fixtures for 10 Gbps applications. A commercially available relay was selected and integrated into a typical ATE test fixture design. Special consideration was given to the footprint optimization through 3D-EM simulation and the use of passive equalization to compensate for some of the relay losses. The paper concludes with measurements of an experimental test fixture using an ATE system running 10 Gbps.
Starting Page	1
Ending Page	10
File Size	1183800
Page Count	10
File Format	PDF
ISBN	9781424411276
ISSN	10893539
DOI	10.1109/TEST.2007.4437582
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-10-21
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fixtures Circuit testing Electronic equipment testing Costs Production Automatic testing Switches Digital relays Instruments System testing
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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