NDLI: A low cost test data compression technique for high n-detection fault coverage

Content Provider	IEEE Xplore Digital Library
Author	Seongmoon Wang Zhanglei Wang Wenlong Wei Chakradhar, S.T.
Copyright Year	2007
Description	Author affiliation: NEC Labs. America, Princeton, NJ (Seongmoon Wang)
Abstract	This paper presents a test data compression scheme that combines weighted random pattern testing and LFSR reseeding. Test patterns generated by the proposed decompressor can achieve high n-detection fault coverage. The proposed technique computes weight sets from a set of test cubes that are generated by a traditional 1-detection ATPG tool. The computed weight sets are modified to achieve high n-detection fault coverage. The proposed decompressor can be implemented with low area overhead. Since the proposed technique requires no special ATPG that is customized for the proposed scheme, it can compress test patterns generated by any ATPG tool and generate test patterns from the compressed test data that achieve high n-detection fault coverage. Experimental results show that test patterns generated by the proposed decompressor can achieve very high 5-detection stuck-at fault coverage and high compression for large benchmark circuits.
Starting Page	1
Ending Page	10
File Size	387025
Page Count	10
File Format	PDF
ISBN	9781424411276
ISSN	10893539
DOI	10.1109/TEST.2007.4437612
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-10-21
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Costs Test data compression Circuit faults Circuit testing Test pattern generators Automatic test pattern generation Automatic testing Fault detection National electric code System testing
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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