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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Carlsson, G. Holmqvist, J. Larsson, E. |
| Copyright Year | 2007 |
| Description | Author affiliation: Ericsson AB, Stockholm (Carlsson, G.) |
| Abstract | Integrated circuits, printed circuits boards, and multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/ IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol requirements. We have taken the Standard Test and Programming Language (STAPL), which is built around a player (interpreter), and defined required extensions. The extensions have been implemented in an extended version of STAPL and we have made experiments with a PC acting as test controller and an FPGA being the DUT. |
| Starting Page | 1 |
| Ending Page | 9 |
| File Size | 307199 |
| Page Count | 9 |
| File Format | |
| ISBN | 9781424411276 |
| ISSN | 10893539 |
| DOI | 10.1109/TEST.2007.4437658 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-10-21 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Circuit testing System testing Access protocols Instruments Printed circuits Integrated circuit testing Communication standards System-on-a-chip Computer languages Field programmable gate arrays |
| Content Type | Text |
| Resource Type | Article |
| Subject | Applied Mathematics Electrical and Electronic Engineering |
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