NDLI: A novel scheme to reduce power supply noise for high-quality at-speed scan testing

Content Provider	IEEE Xplore Digital Library
Author	Xiaoqing Wen Miyase, K. Kajihara, S. Suzuki, T. Yamato, Y. Girard, P. Ohsumi, Y. Laung-Terng Wang
Copyright Year	2007
Description	Author affiliation: Kyushu Inst. of Technol., Iizuka (Xiaoqing Wen; Miyase, K.; Kajihara, S.; Suzuki, T.; Yamato, Y.)
Abstract	High-quality at-speed scan testing, characterized by high small-delay-defect detecting capability, is indispensable to achieve high delay test quality for DSM circuits. However, such testing is susceptible to yield loss due to excessive power supply noise caused by high launch-induced switching activity. This paper addresses this serious problem with a novel and practical post-ATPG X-filling scheme, featuring (1) a test relaxation method, called path keeping X-identification, that finds don't-care bits from a fully-specified transition delay test set while preserving its delay test quality by keeping the longest paths originally sensitized for fault detection, and (2) an X-filling method, called justification-probability-based fill (JP-fill), that is both effective and scalable for reducing launch-induced switching activity. This scheme can be easily implemented into any ATPG flow to effectively reduce power supply noise, without any impact on delay test quality, test data volume, area overhead, and circuit timing.
Starting Page	1
Ending Page	10
File Size	424567
Page Count	10
File Format	PDF
ISBN	9781424411276
ISSN	10893539
DOI	10.1109/TEST.2007.4437632
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-10-21
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Power supplies Noise reduction Circuit testing Delay effects Timing Neodymium Lab-on-a-chip Circuit noise Research and development Gas detectors
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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