NDLI: Combined optical and electrical analysis of AlGaN-based deep-UV LEDs reliability

Content Provider	IEEE Xplore Digital Library
Author	Meneghini, M. Trivellin, N. Trevisanello, L. Lunev, A. Jinwei Yang Bilenko, Y. Wenhong Sun Shatalov, M. Gaska, R. Zanoni, E. Meneghesso, G.
Copyright Year	2008
Description	Author affiliation: Dept. of Inf. Eng., Univ. of Padova, Padova (Meneghini, M.; Trivellin, N.; Trevisanello, L.)
Abstract	This paper describes an analysis of the reliability of AlGaN-based deep-UV Light-Emitting Diodes (LEDs) emitting in the range 280-340 nm. LEDs have been aged at their nominal operating current, and during treatment their electrical and optical characteristics have been continuously monitored. Measurement results show that (i) constant current stress can induce degradation of the optical power emitted by the devices; (ii) degradation is more prominent at low measuring current level, thus suggesting that efficiency decrease is related to the generation of non-radiative paths; (iii) degradation does not imply a significant variation of the operating voltage of the devices, thus indicating that the characteristics of the ohmic contacts are stable over stress time; (iv) optical power decrease takes place together with modifications of the C-V apparent charge profiles, indicating that the generation of non-radiative paths is related to charge instabilities in the QW region.
Starting Page	441
Ending Page	445
File Size	164346
Page Count	5
File Format	PDF
ISBN	9781424420490
DOI	10.1109/RELPHY.2008.4558925
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-04-27
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Light emitting diodes Stimulated emission Degradation Current measurement Charge measurement Power measurement Stress measurement Time measurement Optical devices Character generation Deep-Ultraviolet Light Emitting Diode Reliability
Content Type	Text
Resource Type	Article

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