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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Shin, J.L. Tam, K. Huang, D. Petrick, B. Pham, H. Changku Hwang Hongping Li Smith, A. Johnson, T. Schumacher, F. Greenhill, D. Leon, A.S. Strong, A. |
| Copyright Year | 2010 |
| Description | Author affiliation: Sun Microsystems, Santa Clara, CA, USA (Shin, J.L.; Tam, K.; Huang, D.; Petrick, B.; Pham, H.; Changku Hwang; Hongping Li; Smith, A.; Johnson, T.; Schumacher, F.; Greenhill, D.; Leon, A.S.; Strong, A.) |
| Abstract | This next generation of Chip Multithreaded (CMT) SPARC SoC processor, code named Rainbow Falls, doubles on-chip thread count over its predecessor the UltraSparc T2+. The chip offers high levels of integration and scalability with twice the number of cores, a larger L2 cache, and higher maximum I/O bandwidth, within the same power envelope. Sixteen 8-threaded enhanced SPARC cores (SPC) provide 128 threads in a single die, delivering the highest thread count for a general-purpose microprocessor. The new cache coherency further allows up to 4-way glueless systems with a total of 512 threads. Each core communicates with the unified 6MB L2 cache through a crossbar (CCX) delivering 461GB/s (Fig. 5.2.1). A gasket (CXG) is also introduced to manage the congestion and synchronization of the massive interconnect between the 16 cores and the crossbar. This facilitates a synchronized delay control between any core and any L2 bank for partial core product binning and testing. |
| Starting Page | 98 |
| Ending Page | 99 |
| File Size | 4377426 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781424460335 |
| ISSN | 01936530 |
| e-ISBN | 9781424460366 |
| DOI | 10.1109/ISSCC.2010.5434030 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-02-07 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Clocks Bandwidth Decision feedback equalizers Random access memory Integrated circuit interconnections Logic testing Phase locked loops |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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