NDLI: Modeling, Design, and Verification for the Analog Front-end of a MEMS-based Parallel Scanning-probe Storage Device

Content Provider	IEEE Xplore Digital Library
Author	Hagleitner, C. Bonaccio, T. Rothuizen, H. Wiesmann, D. Lienemann, J. Korvink, J. Cherubini, G. Eleftheriou, E.
Copyright Year	2006
Description	Author affiliation: IBM Zurich Res. Lab. (Hagleitner, C.)
Abstract	The paper presents an integrated analog front-end (AFE) for the read-channel of a parallel scanning-probe storage device. The read/write element is based on an array of microfabricated silicon cantilevers equipped with heating elements to form nanometer-sized indentations in a polymer surface using integral atomic-force microscopy (AFM) tips. A detailed model based on a combination of a thermal/electrical lumped-element model and behavioral model of the electrostatic/mechanical part was developed. The behavioral model of the electrostatic/mechanical part is automatically generated from a full finite-element model (FEM). The model is completely implemented in Verilog-A and was used to co-develop the integrated analog front-end circuitry together with the read/write cantilever. The model and the analog front-end were simulated together and the results were experimentally verified. The approach chosen is well suited for system-level simulation and verification/extraction in a design environment based on standard EDA tools
Starting Page	193
Ending Page	196
File Size	3866323
Page Count	4
File Format	PDF
ISBN	1424400759
DOI	10.1109/CICC.2006.320886
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-09-10
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Silicon Polymers Atomic force microscopy Electrostatics Hardware design languages Circuit simulation Surface resistance Resistance heating Electric resistance Thermal conductivity
Content Type	Text
Resource Type	Article

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