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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Singh, A. Tharian, J. Plusquellic, J. |
| Copyright Year | 2003 |
| Description | Author affiliation: Dept. of Comput. Eng., Maryland Univ., Baltimore, MD, USA (Singh, A.; Tharian, J.; Plusquellic, J.) |
| Abstract | Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (i/sub DDT/) drawn by the core logic from the power supply pads in a CMOS digital circuit. In previous work, we develop a test procedure that can be used both to detect signal variations caused by defects and to obtain delay information in defect free chips. Phase spectra of transient signals obtained using discrete Fourier transform are shown to track path delays of defect-free chips under a wide range of process variations. However, in recent work, we were able to demonstrate through simulation experiments incorporating deep submicron transistor models, a circuit design and path sensitization scenario in which our existing TSA method is not able to yield accurate predictions of path delays. More specifically, a circuit composed of two inverter chains constructed with widely varying transistor sizes was shown to produce path delays that were weakly correlated across a set of worst case process models. In this paper, an alternative wavelet-based analysis of i/sub DDT/ waveforms is shown to improve the accuracy of predicting multiple path delays under these conditions. |
| Sponsorship | IEEE IEEE Circuits and Syst. Soc. IEEE Comput. Soc. ACM Special Interest Group on Design Automation |
| Starting Page | 748 |
| Ending Page | 753 |
| File Size | 479491 |
| Page Count | 6 |
| File Format | |
| ISBN | 1581137621 |
| DOI | 10.1109/ICCAD.2003.159760 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-11-09 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Association for Computing Machinery, Inc. (ACM) |
| Subject Keyword | Delay estimation Power supplies Transient analysis Wavelet analysis Signal analysis Circuit testing CMOS logic circuits Logic testing Predictive models Logic devices |
| Content Type | Text |
| Resource Type | Article |
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